Solid-state analysis spectrophotometer expert U-4100， Further technical improvements have been achieved. UH4150 come out!

Now, UH4150 The spectrophotometer has been released and adhered to U-4100 high reliability. U-4100 A total of 1,500 have been released^*1Multiple units.

Features

Switching the detector wavelength will produce a small signal difference, even so UH4150 High-precision measurement can also be achieved

Multiple detectors mounted on the integral sphere can be measured in the wavelength range of UV-visible-near infrared. Due to the use of Hitachi's professional integral sphere structure technology and signal processing technology, the change in absorbance value (variance in signal level) when the detector is switched is minimized.

Example of data for measuring nearby wavelengths when detector switching
（Absorption spectrum of gold nanorods)

Hitachi's high-performance prism-grating dual monochromator system enables low stray light and low polarization

UH4150 Use prism-grating ( P-G） Optical system of double monochromator, adhere to U-4100 Features of optical systems. Even for samples with low transmittance and reflectivity, UH4150 Low noise measurement can also be achieved.

Parallel beams enable accurate determination of reflected and scattered light

The incident angle is very important for the determination of specular reflectivity of solid samples. For converging beams, since the incident angle will vary according to factors such as the focal length of the lens, the simulated design values of optical films such as conductive multilayer films and prisms will be different from the actual measured values. However, for parallel beams, the incident angle relative to the sample is always the same, achieving the determination of high-precision specular reflectivity. In addition, parallel beams can be used for evaluating diffusion rate (haze) and determining lens transmittance.

Specular reflectivity measurement example

A variety of detectors suitable for different measurement purposes can be provided

Eight integral spheres of different materials, sizes and shapes can be used.^*2*3

Detector product line

Adopt a new ergonomic design

Improve sample chamber doors and improve operability. In order to facilitate the operation of replacing samples and accessories, an ergonomic design is adopted.

Compatible with multiple U-4100 appendix

Universal accessories are suitable for both models. U-4100 Type accessories are also available in UH4150 type^*4Because the accessories are removable, it is suitable for more measurement types.

Compare U-4100 Higher sample throughput

Inheriting U-4100 while high performance of the optical system UH4150 Provides higher throughput assays. The previous model of the instrument is 1 nm When measuring under data intervals, the scanning speed must be 600. mm/min。UH4150 Types can be at 1,200 nm/min The scanning speed is 1 nm The intervals are measured, which significantly shortens the measurement time. *5UH4150 From 240 in about 2 minutes nm Measured to 2,600 nm。 Especially effective for samples that need to be measured in the UV-visible-near-infrared wavelength range, such as solar reflective materials.

Specification

*1by U-4000 Type and U-4100 Total, data as of October 2012

*2Points ball detection system
When purchasing a spectrophotometer for calibration and performance inspection, it must include any of the above 60 mm Points ball

*3Direct light detection system
A built-in direct light detector for calibration and performance inspection. If you need to replace the built-in detector of the spectrophotometer, please purchase any The above-mentioned integral sphere detectors.

*4Some accessories are not universal. When replacing the detector-related accessories, the cable must be adjusted or replaced.

*5Please set appropriate measurement parameters, including scanning speed, based on sample characteristics and measurement purposes.

*Please consult with the dealer 150 mm System specifications for standard, high sensitivity integral sphere or angle continuous variable absolute reflection accessories.

*This system is only used for scientific research and cannot be used for the treatment or diagnosis of any animal or human.

System product line

Direct light detection system

The direct light detector is built into the spectrophotometer. Other optional detectors are available to replace direct light detectors such as various integral spheres and angle continuous variable absolute reflection accessories.

Points ball detection system

A variety of 60 can be used mm Points. Optional accessories: 150 mm Integrated sphere or angle continuous variable absolute reflection attachment (listed here is 60 mm standard integral ball).

Application example

Determination of transmittance of micro samples

Micro sample transmittance measurement accessories can be used for transmittance measurement of samples such as microglass and camera lenses.

Image lens measurement example

Determination of transmittance of micro sample ( P/N 1J0-0204）

*Replace the light source mask must be used as included φ4 mm Light source mask.

Determination of diffuse reflectivity

The sample can be placed behind the integral sphere (the incident angle on the sample side is 0 °）Determine the diffuse reflectivity of powder and other samples.

Example of titanium dioxide diffuse reflectivity measurement

60 mm Standard integral sphere (total and diffuse reflection) ( P/N 1J1-0120）